Atomic force microscope LAFM-A10
- Operation modes: Contact mode, friction mode, extended modes of tapping phase, MFM, EFM, scans at random angle
- Scan angle: Random angle
- Maximum scan range: X/Y axis: 20 µm, Z axis: 2 µm
- Optical system/ Magnification of CCD: Magnification: 4x, Resolution: 2.5 µm
