XRF-Spectrometer LXRF-A10 is a microprocessor controlled high-count throughput unit with low detection limits for wide range of elements. Provision of multi-elemental analysis with detection limits upto 1 ppm. Built-in movable platform for easy location of testing point.High resolution detector improves analysis accuracy. Equipped with safety features of optical tube shielding with no X-ray radiation and high voltage emergency locking.

Measureable elements S to U
Detection limit 1 ppm
Temperature 15 ~ 30 °C
Elemental content 1 ppm to 99 %
Repeatability 0.001
Stability 0.001
Power supply AC 220 V ± 5 V
Dimensions 550 x 410 x 320 mm
Weight 45 kg
  • Detection limit – 1 ppm
  • Measureable elements – S to U
  • Elemental content – 1 ppm to 99 %
  • Movable sample platform for easy detection of testing point
  • Built-in electric cooling Si-PIN detector
  • Safety features - optical tube shielding with no X-ray radiation and high voltage emergency locking
Used in detection of plating thickness of metals, concentration of plating solution , RoHS detection and analysis, full-element analysis and electro plating industries

XRF Spectrometer

Handheld XRF Spectrometer LXRF-B11

Handheld XRF Spectrometer LXRF-B11

  • Analytical Method
  • Energy dispersive X-ray fluorescence analytical Method
  • Elements Measuring
  • Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
  • Range
  • Simultaneous detector
Handheld XRF Spectrometer LXRF-B10

Handheld XRF Spectrometer LXRF-B10

  • Analytical Method
  • Energy dispersive X-ray fluorescence analytical Method
  • Elements Measuring
  • Atomic number from 12 to 92 [elements from magnesium (Mg) to uranium (U)] can be measured
  • Range
  • Simultaneous detector

FTIR Spectrometer

FTIR Spectrometer LIR-B10

FTIR Spectrometer LIR-B10

  • Spectral Range
  • 7800 cm-1 to 350 cm-1
  • Resolution
  • 0.85 cm-1
  • Wave number precision
  • ± 0.01 cm-1

Atomic Fluorescence Spectrometer

Atomic Fluorescence Spectrometer LAFS-A10

Atomic Fluorescence Spectrometer LAFS-A10

  • Beam Configuration
  • Dual Channel
  • Elements ( Measuring Range )
  • As, Se, Pb, Bi, Sb, Te, Sn< 0.01 µg/LHg, Cd< 0.001 µg/LZn< 1.0 µg/LGe< 0.1 µg/L
  • Precision ( RSD )
  • < 1.0

ICP Spectrometer

ICP Spectrometer LICP-A11

ICP Spectrometer LICP-A11

  • Wavelength range
  • 180 to 900 nm
  • Elements per minute
  • 15 elements
  • Temperature
  • 29 °C
ICP spectrometer LICP-A10

ICP spectrometer LICP-A10

  • Wavelength range ( 3600 lines / mm )
  • 180 to 500 nm
  • Wavelength range ( 2400 lines / mm )
  • 180 to 800 nm
  • Temperature
  • 20 ~ 28 °C
ICP Spectrometer LICP-B10

ICP Spectrometer LICP-B10

  • Monochromator Specifications
  • Optical typeCzerny turnerResolution≤ 0.015nm (3600 line grating) ≤ 0.030nm (2400 line grating)Focal length1000 mmGrating specificationshuge holographic grating with 3600 L/mil or 2400 L/mil and 80 mm × 100 mm of ruling areaWavelength range195 to 500 nm for 3600 line grating 195 to 800 nm for 2400 line grating
  • Solid State Power Specifications
  • Frequency27.12 MHz Frequency stability: < 0.05%Spray chamberScott double pass spray chamberOutput power800 W to 1600 W, adjustable with power efficiency more than 65%Output power stability≤ 0.05%Induction coil25 mm × 3 ID (ID-internal diameter), equipped with three concentric quartz torch tubes 35 mm ED (ED-external diameter)
  • Technical Specifications
  • Suitable sample content rangeLiquid sample: 0.01 ppm to several thousand ppm Solid or power sample: 0.001% to 70%Repeatabilityshort-term stability- RSD ≤ 1.5% Long-term stability: RSD ≤ 2%Test speed5 to 8 elements / minLimits of detection (LOD, µg/L) for most elements1ppb to 10ppb

XRD Diffractometer

XRD Diffractometer LXRD-A10

XRD Diffractometer LXRD-A10

  • X-ray Tuble
  • Glass tube, Ceramic tube, Ripple Ceramic tube: Cu, Fe, Co, Cr, Mo etc., Power 2 kW
  • Focus Size
  • 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm
  • Stability
  • ≤ 0.01 %